WebFully compatible with Hitachi SEMs EM-Tec versatile SEM stage adapters for Hitachi SEMs, FESEMs, FIBs, FIB-SEM and TM table top SEMs The EM-Tec versatile SEM stage adapters for Hitachi SEM, FESEMs, FIBs, FIB-SEM systems and TM tabeletop SEMs are offered in eight different styles to cover virtually all Hitachi SEMs: WebHitachi SU8030 Cold source Field Emission SEM. Spatial resolution of 1.0 nm at 15kV and 1.3 nm at 1kV; Highest resolution SEM in the lab. Double condenser optics. A large specimen chamber. High resolution Through The Lens (TTL) SE detector (upper). In chamber topographical SE detector (lower).

NB5000 nanoDUE

WebScanning Electron Microscopy (SEM) Hitachi SU8010; Hitachi SU-8230 SEM; LEO 1530 SEM; Zeiss Ultra 60 SEM; Thermo Helios 5 CX; Thermo Axia ChemiSEM; Transmission Electron Microscopy (TEM) JEOL 100CX … Web• The Hitachi NX9000 orthogonal FIB-SEM system is advancing the field of material processing by lifting the constraints often encountered by V-shaped FIB-SEM instruments. • An ever increasing need for three-dimensional signal capture and reconstruction often demand a large amount of time for post processing. – FIB-SEM Design • Design layout how to host a small group

NX9000 Orthogonal FIB-SEM - Microscopy Society of America

WebFIB-SEM instruments generate exactly this kind of data by combining the precise sample modification of FIB with the high-resolution imaging of SEM. DualBeam instruments Thermo Fisher Scientific is the industry leader in … WebThe Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined … WebThe NX5000: A Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Request A Quote Download PDF Copy Hitachi has introduced a high performance TripleBeam™ FIB-SEM—called NX5000—that enables … joints medical terminology